Testable IC having analog and digital circuits

摘要

The invention relates to an integrated circuit with at least an analog and a digital circuit that are interconnected by a signal path. In order to enable separate testing of the circuits, for example in accordance with the macro test approach, in the signal path a special seam circuit (200) is inserted. The seam circuit (200) is essentially a feedback loop (214) having a scannable flip-flop (210) and a multiplexer (220). The flip-flop (210) feeds a first input of the multiplexer (220), whereas a second input of the multiplexer (220) establishes an input (230) of the seam circuit (200). An output of the feedback loop (214) establishes an output of the seam circuit (200). The state of the multiplexer (220) defines the state of the seam circuit (200), in a first state of the multiplexer (220) the seam circuit (200) being transparent for signals being transferred along the signal path from one circuit to another, and in a second state of the multiplexer (220) the seam circuit (200) outputting a signal that was loaded in the feedback loop (214) beforehand.