| 摘要 |
The present invention relates to a semiconductor integrated circuit having function blocks with differing operating frequencies and to a semiconductor integrated circuit wherein the threshold voltages of MOS transistors that configure these function blocks are different for each function block. In first to Nth function blocks (30-1 to 30-N), which are supplied with constant voltages (VC1 to VCN) generated by a constant voltage generation section (20) as power voltages, any variation in operating speed or in the capability of the transistors is detected by an operating state detector (40) as a voltage (Vfre). Further, an operating state encoding section (50) encodes the voltage (Vfre), a voltage output control section (60) modifies basic voltages (VB1 to VBN) of the constant voltage generation section (20), and constant voltages (VC1 to VCN) for the function blocks (30-1 to 30-N) is modified.
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