发明名称 |
ELLIPTICAL POLARIZATION ANALYSER AND METHOD FOR ALIGNING INCIDENT ANGLE USING THE SAME |
摘要 |
PURPOSE: An elliptical polarization analyser and method for aligning incident angle using the same are provided to furnish various incident angles using mechanical coupling without a confocal microscope or a motor and so on. CONSTITUTION: An elliptical polarization analyser(10) includes a main frame(16); a sample stage(11); a polarization part(12); and an analyser part(14). The main frame is semicircular and has a plurality of first grooves(17) formed in radial direction and a second groove(18) formed in circumferential direction. The sample stage is installed on a central area of the main frame and movable in triaxial direction. The polarization part includes a first ball and a second ball inserted in the first grooves, a third ball inserted in the second groove and a contacting device on a surface contacting with the main frame to fix the position thereof to radiate polarization. The analyser part includes a first ball and a second ball inserted in the first grooves, a third ball inserted in the second groove and the contacting device on a surface contacting with the main frame to fix the position thereof to receive light reflected by an upper surface placed on the sample stage.
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申请公布号 |
KR20020035219(A) |
申请公布日期 |
2002.05.11 |
申请号 |
KR20000065406 |
申请日期 |
2000.11.04 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
JUNG, JAE HWA;KWON, DAE GAP;PARK, SEONG RIM |
分类号 |
G01N21/21;(IPC1-7):G01N21/21 |
主分类号 |
G01N21/21 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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