发明名称 ELLIPTICAL POLARIZATION ANALYSER AND METHOD FOR ALIGNING INCIDENT ANGLE USING THE SAME
摘要 PURPOSE: An elliptical polarization analyser and method for aligning incident angle using the same are provided to furnish various incident angles using mechanical coupling without a confocal microscope or a motor and so on. CONSTITUTION: An elliptical polarization analyser(10) includes a main frame(16); a sample stage(11); a polarization part(12); and an analyser part(14). The main frame is semicircular and has a plurality of first grooves(17) formed in radial direction and a second groove(18) formed in circumferential direction. The sample stage is installed on a central area of the main frame and movable in triaxial direction. The polarization part includes a first ball and a second ball inserted in the first grooves, a third ball inserted in the second groove and a contacting device on a surface contacting with the main frame to fix the position thereof to radiate polarization. The analyser part includes a first ball and a second ball inserted in the first grooves, a third ball inserted in the second groove and the contacting device on a surface contacting with the main frame to fix the position thereof to receive light reflected by an upper surface placed on the sample stage.
申请公布号 KR20020035219(A) 申请公布日期 2002.05.11
申请号 KR20000065406 申请日期 2000.11.04
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 JUNG, JAE HWA;KWON, DAE GAP;PARK, SEONG RIM
分类号 G01N21/21;(IPC1-7):G01N21/21 主分类号 G01N21/21
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