发明名称 REDUNDANCY CIRCUIT USING ANTI-FUSE AND METHOD FOR RETRIEVING DEFECTIVE ADDRESS IN SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a redundancy circuit, in which a fuse program state is precisely discriminated without depending on variation of a destruction state of a fuse. SOLUTION: This redundancy circuit has first and second electric fuses, a differential amplifier, a storage circuit, and a switching circuit. Electric characteristics of the first and second electric fuses are varied by applying voltage of some level or more. The differential amplifier receives two signal voltages depending on difference between respective current characteristics of the first and second electric fuses, amplifies the difference of these signal voltages, and outputs it. The storage circuit stores an output from the differential amplifier. The switching circuit makes a state between the differential amplifier and the storage circuit either state of a connected state or a cut-off state.</p>
申请公布号 JP2002133895(A) 申请公布日期 2002.05.10
申请号 JP20010163171 申请日期 2001.05.30
申请人 TOSHIBA CORP 发明人 TODA HARUKI
分类号 G11C11/401;G11C17/16;G11C17/18;G11C29/04;G11C29/44;H01L21/822;H01L27/04;(IPC1-7):G11C29/00 主分类号 G11C11/401
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