发明名称 PROBE PIN
摘要 PROBLEM TO BE SOLVED: To provide a probe pin wherein a crimp or breakage are prevented and an easy and precise test can be made. SOLUTION: Because a lance posture detecting pin 12 of the probe pin is metallic, the probe pin is not broken or damaged even if a lance 1b is hit by the lance posture detecting pin 12 of the probe pin by an insertion of a terminal 2 into an inaccurate position of a connector 1, and moreover the pin is formed with a high precision. Therefore, because the probe pin can be easily and precisely inserted into a connector terminal hole 1a, not only whether an assembly of the terminal 2 is good or bad can be precisely tested, but also a conduction test can be appropriately performed, and as a result an inspection work is improved by that share. Further, it can be inexpensively performed.
申请公布号 JP2002134243(A) 申请公布日期 2002.05.10
申请号 JP20000329553 申请日期 2000.10.27
申请人 YONEZAWA DENSEN KK 发明人 SHIGENO TAKEMI;SHIGA TOSHIHIRO;ABE SHINICHI
分类号 G01R1/067;G01R31/02;H01R43/00;(IPC1-7):H01R43/00 主分类号 G01R1/067
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