发明名称 POLISHING METHOD AND POLISHING TOOL
摘要 <p>PROBLEM TO BE SOLVED: To provide a polishing method which effectively lessens defects (scratches) on a polishing surface for various works, thereby realizing high- quality polishing. SOLUTION: The method of polishing a semiconductor wafer W pressed to and slid along a polishing surface comprises a first polish step of planarizing a surface of the wafer W and a second polishing step of finish-polishing the wafer surface with feeding an abrasives liquid Q, containing elastic grains 3 to the polishing surface at the start or the midway of the polishing process.</p>
申请公布号 JP2002134443(A) 申请公布日期 2002.05.10
申请号 JP20000319196 申请日期 2000.10.19
申请人 EBARA CORP 发明人 HIROKAWA KAZUTO;HIYAMA HIROKUNI;WADA TAKETAKA;MATSUO NAONORI
分类号 B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
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