发明名称 |
POLISHING METHOD AND POLISHING TOOL |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a polishing method which effectively lessens defects (scratches) on a polishing surface for various works, thereby realizing high- quality polishing. SOLUTION: The method of polishing a semiconductor wafer W pressed to and slid along a polishing surface comprises a first polish step of planarizing a surface of the wafer W and a second polishing step of finish-polishing the wafer surface with feeding an abrasives liquid Q, containing elastic grains 3 to the polishing surface at the start or the midway of the polishing process.</p> |
申请公布号 |
JP2002134443(A) |
申请公布日期 |
2002.05.10 |
申请号 |
JP20000319196 |
申请日期 |
2000.10.19 |
申请人 |
EBARA CORP |
发明人 |
HIROKAWA KAZUTO;HIYAMA HIROKUNI;WADA TAKETAKA;MATSUO NAONORI |
分类号 |
B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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