发明名称 IMAGE-PROCESSING UNIT, MARK-MEASURING DEVICE AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To enhance the accuracy of measuring a mark, using an interlacing type storage area sensor. SOLUTION: The mark measuring device obtains the brightness of even numbered fields and odd numbered fields of an image time-divided and stored in the even numbered fields and the odd numbered fields, obtains a constant for correcting the deviations of the brightnesses, and corrects the brightnesses of the even numbered fields and the odd numbered fields by the constant. The mark is measured by using the corrected images.
申请公布号 JP2002134400(A) 申请公布日期 2002.05.10
申请号 JP20000330957 申请日期 2000.10.30
申请人 CANON INC 发明人 TANAKA HIROSHI
分类号 G01B11/00;G03F9/00;G06T1/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G01B11/00
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