发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
A semiconductor device comprises an insulation film (14) formed over a semiconductor substrate (1), a wiring groove (14b) and a hole (14a) formed in the insulation film (14), a first conductive base layer (16) formed in at least one of the wiring groove (14b) and hole (14a) and preventing copper diffusion, a main conductive layer (19) formed over the first base layer (16) and made of copper or a copper alloy in at least one of the wiring groove (14b) and hole (14a), a second base layer (17) formed between the main conductor layer (19) and the first base layer (16), having a metal element which dissolves into the main conductor layer (19) at an interface with the main conductor layer (19), and formed over the first base layer (16) by CVD. |
申请公布号 |
WO0237558(A1) |
申请公布日期 |
2002.05.10 |
申请号 |
WO2001JP09588 |
申请日期 |
2001.11.01 |
申请人 |
FUJITSU LIMITED;SAKAI, HISAYA;SHIMIZU, NORIYOSHI;OHTSUKA, NOBUYUKI |
发明人 |
SAKAI, HISAYA;SHIMIZU, NORIYOSHI;OHTSUKA, NOBUYUKI |
分类号 |
H01L21/768;H01L23/532 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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