发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 A semiconductor device comprises an insulation film (14) formed over a semiconductor substrate (1), a wiring groove (14b) and a hole (14a) formed in the insulation film (14), a first conductive base layer (16) formed in at least one of the wiring groove (14b) and hole (14a) and preventing copper diffusion, a main conductive layer (19) formed over the first base layer (16) and made of copper or a copper alloy in at least one of the wiring groove (14b) and hole (14a), a second base layer (17) formed between the main conductor layer (19) and the first base layer (16), having a metal element which dissolves into the main conductor layer (19) at an interface with the main conductor layer (19), and formed over the first base layer (16) by CVD.
申请公布号 WO0237558(A1) 申请公布日期 2002.05.10
申请号 WO2001JP09588 申请日期 2001.11.01
申请人 FUJITSU LIMITED;SAKAI, HISAYA;SHIMIZU, NORIYOSHI;OHTSUKA, NOBUYUKI 发明人 SAKAI, HISAYA;SHIMIZU, NORIYOSHI;OHTSUKA, NOBUYUKI
分类号 H01L21/768;H01L23/532 主分类号 H01L21/768
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