发明名称 ELECTROSTATIC CHUCK APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To reduce particles which occur after chucking a work on an electrostatic chuck. SOLUTION: The electrostatic chuck apparatus 1 for chucking the work 7 is provided. The apparatus 1 is equipped with a base body 5 and protruding parts 3 which are provided on the surface 2 of the base body 5. The protruding parts 3 are equipped with dielectric parts 3a for chucking the work 7 by touching it, and a stress relaxing part 3b which is displaceable at least at the temperature at the time of chuck.</p>
申请公布号 JP2002134599(A) 申请公布日期 2002.05.10
申请号 JP20000323515 申请日期 2000.10.24
申请人 NGK INSULATORS LTD 发明人 YAMAGUCHI SHINJI
分类号 H01L21/683;H01L21/304;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/683
代理机构 代理人
主权项
地址