发明名称 AN ARRANGEMENT AND A METHOD FOR INSPECTION
摘要 <p>The present invention relates to an arrangement and to a method for non-destructive inspection of joint layer(s) in a multilayer structure (40) comprising at least a first layer (1) with a first outer surface, a second layer (2) with a second outer surface and a joint layer (3) for joining said first and second layers. It comprises a heating arrangement (10) for homogeneously heating up said second outer surface of the multilayer structure (40), a detecting arrangement (20) comprising a thermographic imaging system for registering the infrared radiation pattern representative of the temperature distribution on said first outer surface of the multilayer structure (40) and processing means (30) for, based on the temperature distribution, establishing at least the eventual presence of: (a) cavity/cavities in the joint layer (3).</p>
申请公布号 WO2002037089(A1) 申请公布日期 2002.05.10
申请号 EP2001012312 申请日期 2001.10.25
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