发明名称 |
EXPOSURE EQUIPMENT FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: Exposure equipment for fabricating a semiconductor device is provided to prevent a pattern defect of a wafer from being caused by particles, by eliminating the particles on a wafer stage or the back surface of the wafer before an exposure process is performed. CONSTITUTION: The wafer(216) on which photoresist is applied is settled on the wafer stage(214). A pattern is formed on a reticle(212) installed in the upper portion of the wafer stage. A lens unit is installed between the reticle and the wafer stage. When an isolation space is formed between the upper surface of the wafer stage and the bottom surface of the wafer, an air cleaner(235) generates flow of fluid in the isolation space. A fluid flow unit generates flow of the fluid in the air cleaner. A particle removing unit(230) removes the particles on the upper surface of the wafer stage and on the bottom surface of the wafer. A control unit(220) controls the exposure equipment and the particle removing unit.
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申请公布号 |
KR20020034523(A) |
申请公布日期 |
2002.05.09 |
申请号 |
KR20000064910 |
申请日期 |
2000.11.02 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
BAE, YONG GUK;SUNG, SEUNG WON |
分类号 |
H01L21/027;G03F7/20;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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地址 |
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