| 摘要 |
PROBLEM TO BE SOLVED: To improve the efficiency of an analog and digital characteristic test and suppress the manufacturing cost of the analog and digital characteristic test circuit. SOLUTION: A plurality of different test condition data A-N are successively outputted from a test controller 1, the output number of the test condition data is counted by a counter circuit 3, and the data writing clock outputted from the test controller 1 according to the counted value is distributed by a clock distributing circuit 4 to write corresponding test condition data in analog and digital characteristic measuring circuits 61-6n, respectively.
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