发明名称 APPARATUS AND METHOD FOR PLATING
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for plating, which keeps the reacting surface of a semiconductor substrate constantly and accurately at a predetermined temperature during plating reaction, plates the substrate stably and surely, and improves throughput. SOLUTION: This apparatus for plating comprises a plating bath 10 as a thermostatic chamber which maintains the temperature to be higher in the inside space than the outside air. The plating bath 10 comprises a holding means 11 for holding a surface to be plated of the semiconductor substrate upward- facing, a sheathing member 15 for sealing perimeter of the plated surface of the semiconductor substrate W held by the holding means 11, and a showerhead 19 for supplying a plating solution on the plated surface of the semiconductor substrate W sealed with the sheathing member 15.
申请公布号 JP2002129349(A) 申请公布日期 2002.05.09
申请号 JP20000327801 申请日期 2000.10.26
申请人 EBARA CORP 发明人 MISHIMA KOJI;INOUE HIROAKI;KARIMATA TSUTOMU;KUNISAWA JUNJI
分类号 C23C18/31;C25D7/12;C25D21/02;H01L21/288;H01L21/3205;(IPC1-7):C23C18/31;H01L21/320 主分类号 C23C18/31
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