发明名称 Low dielectric constant film having thermal resistance, process for forming the same, insulation film between semiconductor layer using the same, and semiconductor device
摘要 There is provided a film, which is excellent in thermal resistance, has low dielectric constant, and is applicable to a semiconductor device or electric appliances. The low dielectric constant film having thermal resistance comprises molecules comprising boron, nitrogen, and hydrogen, wherein the number of the nitrogen atom is 0.7 to 1.3 and the number of the hydrogen atom is 1.0 to 2.2 based on one boron atom, and of which dielectric constant is at most 3 2.4.
申请公布号 US2002053653(A1) 申请公布日期 2002.05.09
申请号 US20010941766 申请日期 2001.08.30
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TSUNODA SEI;NOBUTOKI HIDEHARU;MIKAMI NOBORU
分类号 H01L21/31;C01B35/14;C23C16/38;H01B3/02;H01L21/312;H01L21/314;H01L21/318;H01L21/768;H01L23/522;(IPC1-7):H01B3/20;E04B1/74;H01L21/469;H01L29/00 主分类号 H01L21/31
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