发明名称 |
POSITIVE RESIST COMPOSITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a positive resist composition having excellent sensitivity and resolution, hardly generating development residue or development defect and exhibiting excellent shape of pattern profile. SOLUTION: The positive resist composition contains a compound (A) generating an acid by the irradiation with an active ray or radiation, a resin (B) having a monocyclic or polycyclic alicyclic hydrocarbon structure in the main chain or the side chain and increasing the solubility in an alkali developer by the decomposition with the action of the acid and a compound (C) expressed by a specific structure. |
申请公布号 |
JP2002131910(A) |
申请公布日期 |
2002.05.09 |
申请号 |
JP20000325915 |
申请日期 |
2000.10.25 |
申请人 |
FUJI PHOTO FILM CO LTD |
发明人 |
FUJIMORI TORU;TAN SHIRO;NAKAO HAJIME |
分类号 |
G03F7/039;C08F220/10;C08K5/00;C08L101/02;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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