发明名称 X-RAY FOREIGN MATTER DETECTOR
摘要 <p>PROBLEM TO BE SOLVED: To enable the presence/absence of foreign matters in an object to be inspected to be confirmed at a glance by displaying a total image of the object, when exposed to X-rays in an optimum display area according to a length of the object. SOLUTION: The display area 6a of a display 6 is varied according to the length of the object to be inspected. The total image A of the object, showing an internal state when the object is exposed to X rays, is displayed by the display area 6a optimum to the length of the object. At the same time, a determination as to whether the object is proper and an inspection result C are displayed together in the display area 6a, excluding the total image A.</p>
申请公布号 JP2002131247(A) 申请公布日期 2002.05.09
申请号 JP20000325780 申请日期 2000.10.25
申请人 ANRITSU CORP 发明人 SUZUKI TAKASHI
分类号 G01B15/00;G01N23/04;(IPC1-7):G01N23/04 主分类号 G01B15/00
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