发明名称 DRAM cell constructions
摘要 The invention includes a method of forming a DRAM cell. A first substrate is formed to comprise first DRAM sub-structures separated from one another by an insulative material. A second semiconductor substrate comprising a monocrystalline material is bonded to the first substrate. After the bonding, second DRAM sub-structures are formed in electrical connection with the first DRAM sub-structures. The invention also includes a semiconductor structure which comprises a capacitor structure, and a first substrate defined to encompass the capacitor structure. The semiconductor structure further comprises a monocrystalline silicon substrate bonded to the first substrate and over the capacitor structure. Additionally, the semiconductor structure comprises a transistor gate on the monocrystalline silicon substrate and operatively connected with the capacitor structure to define a DRAM cell.
申请公布号 US2002055225(A1) 申请公布日期 2002.05.09
申请号 US20010012233 申请日期 2001.12.05
申请人 GONZALEZ FERNANDO;BEAMAN KEVIN L.;MOORE JOHN T.;WEIMER RON 发明人 GONZALEZ FERNANDO;BEAMAN KEVIN L.;MOORE JOHN T.;WEIMER RON
分类号 H01L21/02;H01L21/8242;H01L27/108;H01L27/12;(IPC1-7):H01L21/824 主分类号 H01L21/02
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