发明名称 ULTRASONIC FLAW DETECTION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide ultrasonic flaw detection device and method for obtaining the width of a scratch, even if the height of the slit-like scratch opened at the bottom surface of a test piece is equal to smaller than the wavelength, and accurately estimate the height of the scratch and obtain the properties of the scratch. SOLUTION: The ultrasonic flaw detection device comprises a probe 2 for receiving, as echoes, ultrasonic pulses reflected by the slit-like scratch 3 in the test piece, after the ultrasonic pulses have been transmitted into the test piece 1, a scanning mechanism section 4 for moving the probe over the specific scanning range of the test piece and at the same time outputting the spatial position of the probe, and a transmission/ reception device 8 for inputting an echo received from the probe for storage and at the same time, inputting the spatial position of the probe for storage, when the echo is received from the scanning mechanism means, calculating the frequency spectrum of the received echo, calculating the frequency where the amplitude of the frequency spectrum indicates the minimum value, calculating the interval between frequencies where the amplitude is minimal value, and obtaining the size of the slit-like scratch, based on the interval between the frequencies where the amplitude is the minimal value.
申请公布号 JP2002131289(A) 申请公布日期 2002.05.09
申请号 JP20000327324 申请日期 2000.10.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 KIMURA TOMONORI;TANAKA HIROTSUGU;MISU KOICHIRO;WADAKA SHUZO
分类号 G01N29/04;G01N29/07;G01N29/12;(IPC1-7):G01N29/04;G01N29/10 主分类号 G01N29/04
代理机构 代理人
主权项
地址