发明名称 Methods, apparatus and slurries for chemical mechanical planarization
摘要 Methods and apparatus for chemical mechanical planarization of an article such as a semiconductor wafer use polishing slurries including a carbon dioxide solvent or a carbon dioxide-philic composition. A carbon dioxide cleaning solvent step and apparatus may also be employed.
申请公布号 US2002055323(A1) 申请公布日期 2002.05.09
申请号 US20010816956 申请日期 2001.03.23
申请人 MCCLAIN JAMES B.;DESIMONE JOSEPH M. 发明人 MCCLAIN JAMES B.;DESIMONE JOSEPH M.
分类号 B24B37/04;B24B57/02;H01L21/304;(IPC1-7):B24B1/00 主分类号 B24B37/04
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