发明名称 Method for fabricating a memory cell configuration
摘要 A method for fabricating a memory cell configuration, which includes the steps of etching isolation trenches into a semiconductor substrate and thereby forming webs between the isolation trenches and producing bit lines after channel regions have been produced. It furthermore includes performing an etching step which results in the isolation trenches penetrating more deeply into the semiconductor substrate.
申请公布号 US2002055247(A1) 申请公布日期 2002.05.09
申请号 US20010005978 申请日期 2001.12.03
申请人 INFINEON TECHNOLOGIES AG 发明人 REISINGER HANS
分类号 G11C17/08;H01L21/8246;H01L27/112;H01L27/115;(IPC1-7):H01L21/44 主分类号 G11C17/08
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