| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and device, capable of solving the problem of the conventional method on the thermal parasitic loss and structural stability of a thermoelectric matter, and measuring the thermal and electric characteristics of the thermoelectric matter. SOLUTION: The method and device, for measuring a microscopic thermoelectric matter sample and analyzing its characteristics through the use of a scanning microscope, are provided. On the basis of simultaneous thermal and electrical measurements using scanning thermal probes, the applicability of a scanning thermal microscope (SThM) is expanded for analyzing the characteristics of the thermoelectric matter. A thermocouple with two probes is used to measure voltages at the tips and bottom parts of the cone chips of the probes. From the voltages and voltages measured extending over the sample matter, the Seebeck coefficient, thermal conductivity, and resistance of the sample matter are determined accurately.
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