发明名称 |
Method of deposition of a single-crystal silicon region |
摘要 |
The present invention relates to a method of deposition of a silicon layer on a single-crystal silicon substrate, so that the silicon layer is a single-crystal layer, but of different orientation than the substrate, including the steps of defining a window on the substrate; creating inside the window interstitial defects with an atomic proportion lower than one for one hundred; and performing a silicon deposition in conditions generally corresponding to those of an epitaxial deposition, but at a temperature lower than 850° C.
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申请公布号 |
US2002053316(A1) |
申请公布日期 |
2002.05.09 |
申请号 |
US20010988233 |
申请日期 |
2001.11.19 |
申请人 |
GRIS YVON;TROILLARD GERMAINE;MOURIER JOCELYNE |
发明人 |
GRIS YVON;TROILLARD GERMAINE;MOURIER JOCELYNE |
分类号 |
H01L29/73;C30B25/02;H01L21/20;H01L21/205;H01L21/331;H01L29/732;(IPC1-7):C30B23/00;C30B25/00;C30B28/12;C30B28/14 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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