发明名称 Power saving feature during memory self-test
摘要 A microcontroller is configured to interfaces with one or more dual in line memory modules (DIMMs) over an I2C bus and with a memory controller. The microcontroller efficiently retrieves configuration information from the DIMMs and provides it to the memory controller. During system power-up or reset, the memory configuration information, including power consumption parameters, is loaded by the microcontroller into the memory controller. The memory controller utilizes the power consumption parameters to control the rate at which built-in self test (BIST) operations are performed by the DIMMs, thereby conserving power.
申请公布号 US2002056063(A1) 申请公布日期 2002.05.09
申请号 US20010864789 申请日期 2001.05.24
申请人 NERL JOHN A. 发明人 NERL JOHN A.
分类号 G06F1/32;G06F13/16;G11C29/16;(IPC1-7):G06F13/00;G06F12/00;G06F12/14;G06F12/16;G06F13/28;G06F1/26;G01R31/28 主分类号 G06F1/32
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