SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To prevent a clock supplied to a processor part from becoming a minimum pulse in a start and a stop of oscillation even though the clock has been conventionally supplied to the processor part after an oscillation stabilization time is counted by a counter and to prevent increase of the inspection time even when the counter is an asynchronous one. SOLUTION: When an output signal 343 from a gate control part 303 is synchronized with the clock so as to be inputted to a gate circuit 304, the minimum pulse is prevented from being included in a clock input of the processor part 305. As a clock source can be switched to the processor part 305 by means of an external signal input pin 307, an asynchronous circuit 302 is tested at the same time when a scan test is carried out on the processor part 305.