| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC testing device with improved IC test reliability and productivity, its control method, and a storage medium by combining a plurality of ICs under an optional judgement criterion for performing the test. SOLUTION: This IC testing device 1 testing a body to be tested W constituted of a plurality of ICs and outputting a judgement result is provided with a combination setting part 2 setting optional ICs as combination objects among a plurality of ICs, a measurement part 4 performing a test while combining the optional ICs set by the combination setting part 2 with each other according to a predetermined judgement criterion, a display part 6 outputting a function of finding a common judgement result from judgement results for respective ICs and the judgement result, and a storage part 7 storing and accumulating the judgement result.
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