发明名称 Reducing copper line resistivity by smoothing trench and via sidewalls
摘要 A method of fabricating an integrated circuit. A thin liner (110, 210, 310) is deposited over dielectric layer including within a trench (108) and/or via (106). The thin liner (110, 210, 310) smoothes the sidewalls of the trench (108) and/or via (106) and reduces resistivity. The thin liner may comprise an organic or inorganic dielectric (110) or metal (210,310). A copper interconnect structure (116, 216, 316) is then formed over the thin liner (110, 210, 310).
申请公布号 US2002055256(A1) 申请公布日期 2002.05.09
申请号 US20010975571 申请日期 2001.10.11
申请人 JIANG QING-TANG 发明人 JIANG QING-TANG
分类号 H01L23/522;H01L21/3205;H01L21/768;H01L23/52;(IPC1-7):H01L21/44 主分类号 H01L23/522
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