发明名称 BICMOS semiconductor integrated circuit device and fabrication process thereof
摘要 Provided is a BiCOMOS semiconductor integrated circuit device which comprises a semiconductor substrate having an insulating layer internally and partially embedded therein and a semiconductor layer deposited on the insulating layer, an insulated gate type transistor formed in the semiconductor layer, a highly-doped collector layer of a bipolar transistor embedded in an insulating-layer-free portion of the semiconductor substrate, and a low-doped collector layer disposed on the highly-doped collector layer of the bipolar transistor, wherein the height level of the lower portion of the low-doped collector layer is below the height level of the lower portion of the insulating layer so as to attain high breakdown voltage and high speed operation of the bipolar transistor.
申请公布号 US2002053705(A1) 申请公布日期 2002.05.09
申请号 US20010808952 申请日期 2001.03.16
申请人 KONDO MASAO;WASHIO KATSUYOSHI;OUE EIJI;SHIMAMOTO HIROMI 发明人 KONDO MASAO;WASHIO KATSUYOSHI;OUE EIJI;SHIMAMOTO HIROMI
分类号 H01L21/76;H01L21/02;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H01L27/08;H01L27/12;H01L29/165;H01L29/78;H01L29/786;(IPC1-7):H01L29/76 主分类号 H01L21/76
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