发明名称 METHOD FOR MEASURING IMPURITY IN SMELTING LAVA
摘要 PURPOSE: A method for measuring impurity in a smelting lava is provided, which measures a size of an intervening material included in a sample accurately by analyzing a spectrum of an arc generated from the sample. CONSTITUTION: According to the method measuring an amount of an impurity contained in a sample using an OES(Optical Emission Spectroscopy) apparatus analyzing a flash of an arc generated from the sample by applying a high voltage to the sample collected from a smelting lava, an intensity of a spectrum according to time is measured by receiving the spectrum corresponding to one element of the impurity contained in the sample. Peaks of the intensities of the spectrum are analyzed according to the frequency of generation as to the intensity of the spectrum. Intensities and frequencies of the spectrum indicating peaks out of a normal distribution are extracted from the analysis data of the frequency of generation as to the intensities of the spectrum. And a size of the impurity constituting one element is calculated from the intensity of the extracted spectrum. Then, the whole content of the impurity of one element included in the sample is calculated by multiplying the frequency of generation of the spectrum corresponding to the calculated size of the impurity by the calculated size of the impurity and adding them.
申请公布号 KR20020033884(A) 申请公布日期 2002.05.08
申请号 KR20000064057 申请日期 2000.10.30
申请人 POSCO 发明人 BAE, JIN SU;SHIN, YONG TAE
分类号 G01N21/25;(IPC1-7):G01N21/25 主分类号 G01N21/25
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