发明名称 METHOD FOR EXTRACTING COORDINATE OF FUSE INCLUDED IN SEMICONDUCTOR DEVICE AND METHOD FOR REPAIRING SEMICONDUCTOR DEVICE USING THE SAME
摘要 PURPOSE: A method for extracting a coordinate of a fuse included in a semiconductor device and a method for repairing the semiconductor device using the same are provided to minimize a possibility of an error. CONSTITUTION: In a semiconductor device having at least one memory device including a number of fuses, the method for extracting a coordinate of the above fuse includes a step of generating a memory layout where a distinguishable fuse name is given to each fuse included in the above memory device(320), and a step of generating a layout of the semiconductor device by arranging the memory layout on a fixed location and along a fixed direction in the semiconductor device(330). And the method also includes a step of obtaining the coordinate of each fuse included in the semiconductor device using the fuse name(340).
申请公布号 KR20020033955(A) 申请公布日期 2002.05.08
申请号 KR20000064220 申请日期 2000.10.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUNG EON
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
代理机构 代理人
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