发明名称 |
METHOD AND DEVICE FOR MEASURING INCLINATION ANGLE OF BASE MATERIAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring an inclination angle which can measure the angle of a base material to be coated easily without using a complicated calculation, even when the tension of the base material is weak, or even when the substrate is thin. SOLUTION: A base material approach angle or a base material retreat angle is measured exactly by measuring the inclination angles of planes E and G parallel to the base material K to be coated or the inclination angle of a plane F perpendicular to the material K by using a clinometer.
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申请公布号 |
JP2002126597(A) |
申请公布日期 |
2002.05.08 |
申请号 |
JP20000320378 |
申请日期 |
2000.10.20 |
申请人 |
RICOH CO LTD |
发明人 |
MURAMATSU SUSUMU;YAMAMOTO KAZUTADA;ONODA SHIGEO;SHIMIZU TOMOHITO;SUZUKI MITSUYOSHI |
分类号 |
G01B21/22;B05C5/02;B05C11/00;B05D1/26;B05D3/00;B05D7/04;(IPC1-7):B05C5/02 |
主分类号 |
G01B21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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