发明名称 METHOD AND DEVICE FOR MEASURING INCLINATION ANGLE OF BASE MATERIAL
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring an inclination angle which can measure the angle of a base material to be coated easily without using a complicated calculation, even when the tension of the base material is weak, or even when the substrate is thin. SOLUTION: A base material approach angle or a base material retreat angle is measured exactly by measuring the inclination angles of planes E and G parallel to the base material K to be coated or the inclination angle of a plane F perpendicular to the material K by using a clinometer.
申请公布号 JP2002126597(A) 申请公布日期 2002.05.08
申请号 JP20000320378 申请日期 2000.10.20
申请人 RICOH CO LTD 发明人 MURAMATSU SUSUMU;YAMAMOTO KAZUTADA;ONODA SHIGEO;SHIMIZU TOMOHITO;SUZUKI MITSUYOSHI
分类号 G01B21/22;B05C5/02;B05C11/00;B05D1/26;B05D3/00;B05D7/04;(IPC1-7):B05C5/02 主分类号 G01B21/22
代理机构 代理人
主权项
地址