发明名称 Verfahren zur Positionsbestimmung und Positionsmesseinrichtung
摘要 The invention relates to a position measurement device, wherein an absolute position measuring value (P) is formed by interpolation from several phase-shifted scanning signals (S1, S2, S3). The position measuring value (P) is formed, during movement of an object to be measured, from stored instantaneous values of the scanning signals (S1, S2, S3). In order to compensate for differing propagation times of the scanning signals (S1, S2, S2) from the point of scanning (A) to the memory elements (13, 14, 15), the instantaneous values are stored at different points in time in a time-delayed manner.
申请公布号 DE10054075(A1) 申请公布日期 2002.05.08
申请号 DE20001054075 申请日期 2000.10.31
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 DRESCHER, JOERG;HAUSSCHMID, MATHIAS;HUBER-LENK, HERBERT;REITER, HERBERT;STREITWIESER, JOHANN;HOLZAPFEL, WOLFGANG
分类号 G01D5/245;G01D5/244;(IPC1-7):G01B11/00;G01D5/36 主分类号 G01D5/245
代理机构 代理人
主权项
地址