发明名称 Manufacturing system for a wafer combining an optical exposure apparatus and an electron beam exposure apparatus
摘要 A manufacturing system for providing a device on a wafer, e.g. a semi conductor wafer, comprising a first exposure apparatus 300 for exposing wafer to a light source whilst moving the wafer a predetermined distance, and a second exposure apparatus 100 for exposing the wafer to a plurality of electron beams, the plurality of electron beams having an interval of substantially N or 1/N times the distance the wafer is moved during exposure to the light source by the first exposure apparatus 300, where N is a natural number. There is further disclosure of multi-axis electron lens (Figs. 3 and 4) having a plurality of openings (204) for allowing passage of the plurality of electron beams.
申请公布号 GB2368716(A) 申请公布日期 2002.05.08
申请号 GB20010023771 申请日期 2001.10.03
申请人 * ADVANTEST CORPORATION 发明人 SHINICHI * HAMAGUCHI;HIROSHI * YASUDA;TAKESHI * HARAGUCHI
分类号 G03F7/20;H01J37/305;H01J37/317;H01L21/027 主分类号 G03F7/20
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