| 摘要 |
Methods and devices are disclosed for measuring barrier properties of a barrier coating or coating arrays where each barrier coating has a small cross section. To reduce the edge effects in the measurements of barrier properties, measurements are made using a waveguide structure that includes at least one waveguide coated with a chemically sensitive layer and an array of barrier coatings. The coated waveguide is exposed to a material of interest that has the ability to produce an analyzable variation in the chemically sensitive layer, thereby providing the ability to detect an impact of the material of interest on the barrier coatings. In one variation, an initial light wave is propagated within the waveguide structure, a resulting wave associated with the initial wave and each barrier coating is detected, and any impacts on the coatings by the material of interest are correlated to a value of a barrier property for each of the array of barrier coatings.
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