发明名称 WET ETCH APPARATUS FOR FABRICATING SEMICONDUCTOR
摘要 PURPOSE: A wet etch apparatus for fabricating a semiconductor is provided to prevent contamination of a wafer in a wet etch process by intercepting a contact between a back face of a wafer and an etching solution. CONSTITUTION: A catch cup is formed in an inside of a process chamber(1). A wafer stage(100) is installed in an inside of the catch cup to absorb a wafer. The first drive arm(7a) and the second drive arm include the first nozzle(8a), the second nozzle(8b), the third nozzle, and the fourth nozzle in order to inject deionized water, a nitrogen gas, and an etching solution to a front face of the wafer. The fifth nozzle(8e) is used for injecting the deionized water to a back face of the wafer. A sealing portion is used for sealing the back face of the wafer and a wafer loading face(101) of the wafer stage(100) to prevent a contact between the injected etching solution and the back face of the wafer.
申请公布号 KR20020032184(A) 申请公布日期 2002.05.03
申请号 KR20000063200 申请日期 2000.10.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, CHANG HWAN
分类号 H01L21/3063;(IPC1-7):H01L21/306 主分类号 H01L21/3063
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