| 摘要 |
PURPOSE: A terminal circuit is provided to apply the test pattern at the level over the wide range to a DUT(Device Under Test) connected to the terminal circuit, and to measure the DUT by applying to both the connected and disconnected states of terminal resistors according to the test condition of the DUT. CONSTITUTION: A terminal circuit(10) is composed of terminal resistors(R14,R15) installed in plural devices under test, and connected to a DUT measuring terminal and a ground of a board; a power supply unit(16) supplying voltage between the other terminal of the terminal resistor and the ground according to measuring condition of the DUT; and a control circuit(17) controlling voltage supplying according to the measuring condition of the DUT. The terminal circuit applies the test pattern at the level over the wide range to the DUT by varying terminal voltage according to test condition of the DUT.
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