| 摘要 |
A method for forming a metal line of a semiconductor device is disclosed, in which a Cu thin film is deposited on a diffusion barrier film after a chemical enhancer and plasma are applied thereon, thereby improving fill characteristics of a contact hole having a ultra-fine structure. The method for forming a metal line in a semiconductor device includes the steps of forming an interlevel insulating film on a semiconductor substrate having a predetermined lower structure, forming a damascene pattern in the interlevel insulating film, forming a diffusion barrier film on a whole structure having the damascene pattern, applying a chemical enhancer on the diffusion barrier film to form a chemical enhancer film on the diffusion barrier film, performing plasma treatment, forming a Cu thin film on the whole structure to fill the damascene pattern, and performing a polishing process to expose an upper surface of the interlevel insulating film so that the Cu thin film only remains within the damascene pattern.
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