发明名称 Chemical-mechanical polishing methods
摘要 A chemical-mechanical polishing (CMP) method includes applying a solid abrasive material to a substrate, polishing the substrate, flocculating at least a portion of the abrasive material, and removing at least a majority portion of the flocculated portion from the substrate. Applying solid abrasive material can include applying a CMP slurry or a polishing pad comprising abrasive material. Such a method can further include applying a surfactant comprising material to the substrate to assist in effectuating flocculation of the abrasive material. Such surfactant comprising material may be cationic which includes, for example, a quaternary ammonium substituted salt. Also, for example, the surfactant comprising material may be applied during polishing, brush scrubbing, pressure spraying, or buffing.
申请公布号 US2002052173(A1) 申请公布日期 2002.05.02
申请号 US20010990706 申请日期 2001.11.20
申请人 ANDREAS MICHAEL T. 发明人 ANDREAS MICHAEL T.
分类号 B08B3/00;B24B37/04;H01L21/306;H01L21/3105;(IPC1-7):B24B1/00 主分类号 B08B3/00
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