发明名称 |
Fabrication of a probe card |
摘要 |
A probe card includes a card plate (14) and a plurality of probe pins (16) fixed onto the card plate (14). Each of the probe pins (16) has a metallic body (32) made of rhenium-containing tungsten, and a nickel film (34) and a rhodium film (36) consecutively formed on the metallic body (32) by a plating technique using a liquid flow of a plating liquid. <IMAGE> |
申请公布号 |
EP1202337(A2) |
申请公布日期 |
2002.05.02 |
申请号 |
EP20010125135 |
申请日期 |
2001.10.23 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
MIKAMI, KAZUNARI |
分类号 |
G01R1/067;C25D7/00;G01R1/073;H01L21/48;H01L21/66;H01L23/485 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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