发明名称 Fabrication of a probe card
摘要 A probe card includes a card plate (14) and a plurality of probe pins (16) fixed onto the card plate (14). Each of the probe pins (16) has a metallic body (32) made of rhenium-containing tungsten, and a nickel film (34) and a rhodium film (36) consecutively formed on the metallic body (32) by a plating technique using a liquid flow of a plating liquid. <IMAGE>
申请公布号 EP1202337(A2) 申请公布日期 2002.05.02
申请号 EP20010125135 申请日期 2001.10.23
申请人 NEC ELECTRONICS CORPORATION 发明人 MIKAMI, KAZUNARI
分类号 G01R1/067;C25D7/00;G01R1/073;H01L21/48;H01L21/66;H01L23/485 主分类号 G01R1/067
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