CHEMICAL MECHANICAL PLANARIZATION OF METAL SUBSTRATES
摘要
A method of polishing a wafer in a carrier with a polishing pad by controlling a ratio of platen speed to carrier speed (PS to CS) within a specific range, or by controlling a first polishing step with a ratio of PS to CS in the range of about 150:1 to about 1:150 followed by a second polishing step with a platen speed of about 0 to 20 rpm while maintaining the carrier speed used in the first polishing step, which maximizes clearing of residual material removed from a patterned wafer surface by polishing.
申请公布号
WO0214014(A3)
申请公布日期
2002.05.02
申请号
WO2001US25038
申请日期
2001.08.09
申请人
RODEL HOLDINGS, INC.
发明人
MANDIGO, GLENN, C.;BARKER, ROSS, E., II;LACK, CRAIG, D.;SULLIVAN, IAN, G.;GOLDBERG, WENDY, B.