METHOD FOR MAKING A BLOCK FOR TESTING COMPONENTS

摘要

The invention concerns a test block (10) for an electronic component, comprising an embossed support layer (12) including a plurality of projecting protrusions (12), said protrusions being respectively equipped in their top parts with at least a conductive testing pad (14), capable of being electrically contacted with a terminal of the component. The invention is useful for controlling bare or housed electronic components.