Semiconductor integrated circuit device

摘要

There is provided a semiconductor integrated circuit device for realizing in the higher accuracy the verification of a plurality of operations of a clock generation circuit to form an internal clock signal and enabling verification for various performances of the internal clock signal generation circuit while simplifying the structure thereof. In such semiconductor integrated circuit device, a measuring circuit for conducting at least two kinds of measurements among the measurements of lock time until the predetermined internal clock signal corresponding to the input clock signal can be obtained, the maximum frequency of the internal clock signal and jitter of the internal clock signal is provided to the clock generation circuit to form the internal clock signal corresponding to the input clock signal inputted from an external terminal. Thereby, operations of the clock generation circuit can be verified with higher accuracy within the semiconductor integrated circuit device.