发明名称 METHOD FOR IMPROVING CHARACTERISTICS OF LOWER ELECTRODE OF CAPACITOR
摘要 PURPOSE: A method for improving characteristics of a ruthenium(Ru) electrode is provided to improve a roughness of the ruthenium electrode by pre-treatment using a plasma. CONSTITUTION: A substrate(1) is performed by pre-treatment using a plasma. Then, a ruthenium thin film(2) is deposited on the substrate(1). The pre-treatment of the substrate(1) is performed under the pressure of 0.1-10 Torr using O2, N2, Ar, Cl2, N2O, H2 or NH3 as a source gas of the plasma. The ruthenium thin film(2) is deposited by PVD(Physical Vapor Deposition). The source of the ruthenium thin film is used as Ru(Cp)2, Ru(EtCp)2, Ru(MeCp)2, Ru(Od)3, Ru3(CO)12, or Ru-acetylacetonate(Ru-AA).
申请公布号 KR20020031525(A) 申请公布日期 2002.05.02
申请号 KR20000062022 申请日期 2000.10.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HA, SEUNG CHEOL
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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