发明名称 Method for producing a semiconductor device with an accurately controlled impurity concentration profile in the extension regions
摘要 A method for producing a semiconductor device comprising the steps of:(A) forming a gate insulating layer on a surface of a semi-conductive layer, and then, forming a gate electrode on a gate insulating layer; (B) introducing an impurity in regions of the semi-conductive layer where source/drain regions are to be formed, and then, carrying out heat treatment for activation of the introduced impurity, to form source/drain regions in the semi-conductive layer, and (C) introducing an impurity into at least regions of the semi-conductive layer where extension regions are to be formed, and then, carrying out heat treatment for activation of the introduced impurity, to form extension regions in the semi-conductive layer.
申请公布号 US6380053(B1) 申请公布日期 2002.04.30
申请号 US20000652508 申请日期 2000.08.31
申请人 SONY CORPORATION 发明人 KOMATSU HIROSHI
分类号 H01L21/265;H01L21/336;H01L29/78;H01L29/786;(IPC1-7):H01L21/00 主分类号 H01L21/265
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