发明名称 Semiconductor device having FET structure with high breakdown voltage
摘要 An N-MOSFET is formed on an SOI substrate consisting of a semiconductor substrate, an insulating layer and an n--active layer. A p-well layer, an n-RESURF layer, and an n-diffusion layer are formed in the surface of the n--active layer between a source electrode and a drain electrode by means of impurity diffusion. The diffusion regions of the p-well layer and the n-RESURF layer overlap with each other. An end of the n-RESURF layer reaches a position below a gate electrode. The diffusion regions of the p-well layer and the n-diffusion layer do not overlap with each other, so that the n-RESURF layer has a region in direct contact with the n--active layer between the p-well layer and the n-diffusion layer.
申请公布号 US6380566(B1) 申请公布日期 2002.04.30
申请号 US20000669737 申请日期 2000.09.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUDAI TOMOKO;KAWAGUCHI YUSUKE;NAKAMURA KAZUTOSHI;NAGANO HIROFUMI;NAKAGAWA AKIO
分类号 H01L29/08;H01L29/78;H01L29/786;(IPC1-7):H01L29/74;H01L31/111 主分类号 H01L29/08
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