| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a compound memory module and a selecting method therefor, which can easily refer to the production history or the like of a compound memory module and can improve yield while effectively utilizing the compound memory module including a defective IC chip. SOLUTION: A plurality of IC chips 2, 3 and 4 including the nonvolatile memory chip 3 are packaged in one package 1 and history information containing the result of the operation test of each of IC chips 2, 3 and 4 is written on the specified region of the nonvolatile memory chip 3. By reading the history information of the respective IC chips 2, 3 and 4 out of the nonvolatile memory chip 3, the IC chip, which is the factor of a defect, can be specified so that the remaining non-defective IC chips can be effectively utilized and diverted to the product of the other purpose or the like. As a result, the ratio of compound memory modules 1 to be processed as defective articles is reduced, the yield is practically improved and the productivity of the compound memory modules 1 can be improved.</p> |
