发明名称 COMPONENT HOLDER FOR TEST DEVICE AND COMPONENT HOLDER SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a component holder for facilitating the handling extremely troublesome mechanically and electrically when mounting a component to be tested onto a test device. SOLUTION: This component holder for testing the electronic component has a carrier 4; at least one component socket 5 having a group of component contacts 6 for retaining and contacting with the component, disposed on the carrier 4; and at least one group of adapter contacts connected to the component contacts 6, disposed in previously decided standard arrangement on the carrier 4. Thereby, a mounting change of the component is not required during the test.
申请公布号 JP2002122631(A) 申请公布日期 2002.04.26
申请号 JP20010146921 申请日期 2001.05.16
申请人 INFINEON TECHNOLOGIES AG 发明人 HAAS HERMANN;LUPKE JENS
分类号 G01R31/26;G01R1/04;G01R1/06;G01R31/01;G01R31/28;G11C29/56;(IPC1-7):G01R31/26 主分类号 G01R31/26
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