发明名称 |
HIGH QUALITY LITHOGRAPHY METHOD |
摘要 |
PROBLEM TO BE SOLVED: To improve a stitching error and surface roughness. SOLUTION: Lithographic processing utilized in the manufacture of a micromachine is troubled to far by a stitching error and an error caused from the surface roughness of a photosensitive material. These errors can be minimized by minimizing the stitching error by a multipass exposure technique. The error due to the surface roughness is minimized by subjecting the surface of the photosensitive material to temperature treatment in such a way that the major part of the photosensitive material is not disturbed. |
申请公布号 |
JP2002122998(A) |
申请公布日期 |
2002.04.26 |
申请号 |
JP20010205020 |
申请日期 |
2001.07.05 |
申请人 |
MEMS OPTICAL INC |
发明人 |
BROWN DAVID R;BOREK GREGG T;LINDSEY RANDY;ERBACH PETE S |
分类号 |
G03B9/08;G02B3/00;G03F1/00;G03F1/78;G03F7/00;G03F7/20;G03F7/38 |
主分类号 |
G03B9/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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