发明名称 HIGH QUALITY LITHOGRAPHY METHOD
摘要 PROBLEM TO BE SOLVED: To improve a stitching error and surface roughness. SOLUTION: Lithographic processing utilized in the manufacture of a micromachine is troubled to far by a stitching error and an error caused from the surface roughness of a photosensitive material. These errors can be minimized by minimizing the stitching error by a multipass exposure technique. The error due to the surface roughness is minimized by subjecting the surface of the photosensitive material to temperature treatment in such a way that the major part of the photosensitive material is not disturbed.
申请公布号 JP2002122998(A) 申请公布日期 2002.04.26
申请号 JP20010205020 申请日期 2001.07.05
申请人 MEMS OPTICAL INC 发明人 BROWN DAVID R;BOREK GREGG T;LINDSEY RANDY;ERBACH PETE S
分类号 G03B9/08;G02B3/00;G03F1/00;G03F1/78;G03F7/00;G03F7/20;G03F7/38 主分类号 G03B9/08
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