发明名称 POLISHING PAD AND WAFER POLISHER
摘要 PROBLEM TO BE SOLVED: To provide a polishing pad used for polishing a wafer, which allows the user to obtain the thickness of a film being polished without releasing the wafer from the surface plate in the middle of polishing and which can make very precise and efficient control of polishing. SOLUTION: The polishing pad has the center of rotation and is used in a rotating state when polishing a wafer. The polishing pad is provided with a window which is relatively long in the direction toward the center of rotation and is relatively short in the direction vertical to the direction toward the center of rotation.
申请公布号 JP2002124498(A) 申请公布日期 2002.04.26
申请号 JP20010240190 申请日期 2001.08.08
申请人 NIKON CORP 发明人 SHIRATORI HARUO
分类号 G01B11/06;B24B37/013;B24B37/20;B24B37/24;B24B49/04;B24B49/12;H01L21/304 主分类号 G01B11/06
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