发明名称 SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing equipment which can control the thickness of the central part and that of the peripheral part of a semiconductor wafer to the same polishing profile and can increase the quantity of slurry to be supplied to the surface of the semiconductor wafer. SOLUTION: In this semiconductor manufacturing equipment, the surface 2a of the semiconductor wafer 2 set and held inside an annular retainer ring 1 is pressed against a polishing pad 3, and under this condition, the semiconductor wafer 2 is polished supplying the slurry 8 onto a contact face between the surface 2a of the semiconductor wafer 2 and the polishing pad 3. A slurry supply port 10 is formed in the lower face of the retainer ring 1 close to the inner surface side 1a.
申请公布号 JP2002124492(A) 申请公布日期 2002.04.26
申请号 JP20000315694 申请日期 2000.10.16
申请人 NEC CORP 发明人 SUGAI KAZUMI
分类号 B24B37/00;B24B37/04;B24B37/30;B24B37/32;H01L21/304 主分类号 B24B37/00
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