Test circuit configuration and method for testing a large number of transistors,申请号WO2001DE00835-传众专利搜索

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发明名称	Test circuit configuration and method for testing a large number of transistors
摘要
申请公布号	WO0167601(A3)	申请公布日期	2002.04.25
申请号	WO2001DE00835	申请日期	2001.03.05
申请人	INFENEON TECHNOLOGIES AG;KOLLMER, UTE;SCHAPER, ULRICH;LINNENBANK, CARSTEN;THEWES, ROLAND	发明人	KOLLMER, UTE;SCHAPER, ULRICH;LINNENBANK, CARSTEN;THEWES, ROLAND
分类号	G01R31/26;G01R31/27;G01R31/30;G11C29/50;(IPC1-7):G01R31/27	主分类号	G01R31/26
代理机构		代理人
主权项
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